Simulations
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SimCtrl001 - Basic System Operation Tests
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* This sim takes quite some time to run *

Test System Check Resister
Test access to System SRAM (Read/Write - Single/Block)
Test EEPROM Block RAM Access.
Test EEPROM to EEPROM Block RAM Operation (not self-checking yet)
Test EEPROM Block RAM to EEPROM operation (not self-checking yet)
Test FPGA Configuration operation


SimCtrl002 - Mainly testing the amplitude metric.
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+Ve Threshold - Test pattern 0
Detect Amplitude of 1st, 2nd, 3rd, 4th, last and largest peaks

Bipolar - Test pattern 0
Detect Amplitude of 1st, 2nd, 3rd, 4th, 5th, 6th, last and largest peaks

+Ve Threshold - Test pattern 1
Detect Amplitude of 1st, 2nd, 3rd, 4th, last and largest peaks

Bipolar - Test pattern 1
Detect Amplitude of 1st, 2nd, 3rd, 4th, 5th, 6th, last and largest peaks

+Ve Threshold - Test pattern 0 - Distance metric on non-existant peak
Detect Amplitude of 1st, 2nd, 3rd, 4th, last and largest peaks

Bipolar - Test pattern 0 - Distance metric on non-existant peak
Detect Amplitude of 1st, 2nd and 3rd peaks

-Ve Threshold - Test pattern 0
Detecting Amplitude of 1st, 2nd, 3rd, 4th, last and largest peaks


SimCtrl003 - Mainly testing the amplitude metric.
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As 002, but Distance metric is measured at trailing flank


SimCtrl004 - Testing leading flank distance metric.
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+Ve Threshold - Test pattern 0
Detect Distance of 1st, 2nd, 3rd, 4th, last and largest peaks

Bipolar - Test pattern 0
Detect Distance of 1st, 2nd, 3rd, 4th, 5th, 6th, 7th, last and largest peaks

+Ve Threshold - Test pattern 1
Detect Distance of 1st, 2nd, 3rd, 4th, last and largest peaks

Bipolar - Test pattern 1
Detect Distance of 1st, 2nd, 3rd, 4th, 5th, 6th, 7th, last and largest peaks

-Ve Threshold - Test pattern 0
Detect Distance of 1st, 2nd, 3rd, 4th, last and largest peaks


SimCtrl005 - Testing trailing flank distance metric.
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+ve Threshold - Test pattern 1
Detect Distance of 1st, 2nd, 3rd, 4th last and largest peaks

Bipolar - Test pattern 1
Detect Distance of 1st, 2nd, 3rd, 4th, 5th, 6th, 7th, last and largest peaks

-ve Threshold - Test pattern 1
Detect Distance of 1st, 2nd, 3rd, 4th last and largest peaks

+ve Threshold - Test pattern 1
Detect Distance of 1st peak
Closing gates at different times to see which values are seen


SimCtrl006 - Testing peak distance metric.
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+ve Threshold - Test pattern 0
Detect Distance of 1st, 2nd, 3rd, 4th last and largest peaks

+ve Threshold - Test pattern 1
Detect Distance of 1st, 2nd, 3rd, 4th last and largest peaks

Bipolar - Test pattern 1
Detect Distance of 1st, 2nd, 3rd, 4th, 5th, 6th, 7th, last and largest peaks

-ve Threshold - Test pattern 0
Detect Distance of 1st, 2nd, 3rd, 4th last and largest peaks

+ve Threshold - Test pattern 1
Detect Distance of 1st peak using peak distance metric
Closing gates at different times to see which values are seen


SimCtrl007 - Testing sample dropping logic
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+Ve Threshold - Test pattern 0
Detect Amplitude of 1st, 2nd, 3rd, 4th, last and largest peaks

Bipolar - Test pattern 0
Detect Amplitude of 1st, 2nd, 3rd, 4th, 5th, 6th, last and largest peaks


SimCtrl008 - Testing sample dropping logic with 8-bit A-Scan data mode
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+Ve Threshold - Test pattern 0
Detect Amplitude of 1st, 2nd, 3rd, 4th, last and largest peaks

Bipolar - Test pattern 0
Detect Amplitude of 1st, 2nd, 3rd, 4th, 5th, 6th, last and largest peaks






